BIST-Based Diagnosis of FPGA Interconnect

نویسندگان

  • Charles E. Stroud
  • Jeremy Nall
  • Matthew Lashinsky
  • Miron Abramovici
چکیده

We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either on-line or off-line testing. The technique was originally intended for on-line diagnosis of faulty interconnect to support fault-tolerant applications. However, the technique has been proven to be an excellent approach for off-line testing and diagnosis as well, providing high-resolution diagnostics with the ability to identify the faulty wire segment or programmable switch. We have implemented this BIST-based diagnostic approach on the ORCA series FPGA and present the results of testing and diagnosing known defective FPGAs.1

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices

On-chip Built-In Self-Test (BIST) based diagnosis of the embedded Field Programmable Gate Array (FPGA) core in a generic System-on-Chip (SoC) is presented. In this approach, the embedded processor core in the SoC is used for reconfiguration of the FPGA core for BIST, initiating the BIST sequence, retrieving the BIST results, and for performing diagnosis of faulty programmable logic blocks, memo...

متن کامل

A Survey on FPGA On-line Checking Methods

The purpose of FPGA on-line checking is to detect faults that occurs in-field. Depending on whether circuit logic is affected permanently, in-field faults can be categorized into temporal and permanent faults. Temporal faults may come from single-event-upset, ground bounce, power supply noise or crosstalk. Moreover, permanent faults are due to silicon aging, electro-migration and wire/device bu...

متن کامل

BIST for Xilinx 4000 and Spartan Series FPGAs: A Case Study

We discuss the development of Built-In SelfTest (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000XL/XLA and Spartan series Field Programmable Gate Arrays (FPGAs). While there has been prior work in BIST for these FPGAs, the fast-carry logic has not been addressed and only a small portion of the total interconnect resources...

متن کامل

Built - In Self - Test of the Programmable Interconnect in Field Programmable Gate Arrays

Except where reference is made to the work of others, the work described in this thesis is my own or was done in collaboration with my advisory committee. This thesis does not include proprietary or classified information. Testing programmable interconnect resources in Field Programmable Gate Arrays (FP-GAs) is difficult because of the large number of wire segments and switches that must be tes...

متن کامل

Embedded Processor Based Fault Injection and SEU Emulation for FPGAs

Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip (SoC) implementations. The case studies include embedded hard core and soft core processors which manipulate configuration memory bits to emulate physical and transient faults in the FPGA core including shorts and op...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2002